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Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983 (Springer Series in Chemical Physics 36)
A. Benninghoven , J. Okano , R. Shimizu , H. W. Werner
/ Springer Verlag 1984
503 pp., hardcover, FAINT wear to cover edges else very good. Volumes
Included: 1
ISBN: 354013316X
Subject/Keywords: Spectrometry Chemical Physics
Item #: 1283762
$34.91