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X-ray diffraction at elevated temperatures: A method for in situ process analysis
D.D.L. Chung; P.W. De Haven; H. Arnold; Debashis Ghosh
/ VCH 1993
268 pp., hardcover, minor library markings, else text clean and binding tight. Volumes
Included: 1
ISBN: 0895737450
Subject/Keywords: X-ray diffraction
Item #: 1147089
$30.11