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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Khare, Jitendra B., Maly, Wojciech
/ Kluwer 1996
150 pp., Hardcover, ex library else text clean and binding tight. Volumes
Included: 1
ISBN: 0792397142
Subject/Keywords: ntt
Item #: 1126563
$19.82